https://www.selleckchem.com/pr....oducts/ipi-145-ink11
Spatial resolution is an important aspect of many optical instruments. It is defined as the ability of surface-topography measuring instruments to distinguish closely spaced surface features. Following convention, spatial resolution can be defined as the spatial frequency response of the instrument, known as the instrument transfer function (ITF). In this paper, we describe the step-artifact approach for estimating the ITF for 3D scanners, discuss step artifact characterization and validation approaches, and present a method to
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