https://www.selleckchem.com/JAK.html
This research work aimed to investigate the effects of microstructures, dielectric property and temperature distributions on drying feature difference between the mushroom cap and stipe during the microwave-vacuum drying (MVD) process. Near-infrared hyperspectral imaging (NIR HSI) was employed to visualize distribution maps for moisture content (MC), dielectric constant ε' and dielectric loss factor ε'' of mushroom slices during the MVD process. Infrared (IR) thermal imaging was used to evaluate the temperature distribution of the mushroom slices. R
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